basila@basila-mint-home ~ $ sudo smartctl --all /dev/sdc1
[sudo] password for basila:
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-37-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Blue (SATA)
Device Model: WDC WD3200AAKS-00VYA0
Serial Number: WD-WMARW0467942
LU WWN Device Id: 5 0014ee 055bd9566
Firmware Version: 12.01B02
User Capacity: 320 072 933 376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.5, 3.0 Gb/s
Local Time is: Sat Jan 23 14:14:36 2016 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 8760) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 104) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 13
3 Spin_Up_Time 0x0003 214 159 021 Pre-fail Always - 2283
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1638
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 051 Old_age Always - 0
9 Power_On_Hours 0x0032 052 052 000 Old_age Always - 35439
10 Spin_Retry_Count 0x0012 100 100 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1389
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1160
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 1906
194 Temperature_Celsius 0x0022 106 091 000 Old_age Always - 41
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 3
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 23694
200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 37 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 37 occurred at disk power-on lifetime: 35429 hours (1476 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 00 f8 27 e0 Error: UNC at LBA = 0x0027f800 = 2619392
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 f8 27 09 08 00:01:10.837 READ DMA EXT
25 00 00 00 d4 27 09 08 00:01:10.201 READ DMA EXT
25 00 00 00 d0 27 09 08 00:01:10.187 READ DMA EXT
25 00 00 00 4c 28 09 08 00:01:10.160 READ DMA EXT
25 00 00 00 48 28 09 08 00:01:10.149 READ DMA EXT
Error 36 occurred at disk power-on lifetime: 35412 hours (1475 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 50 8c f3 e0 Error: UNC 8 sectors at LBA = 0x00f38c50 = 15961168
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 50 8c f3 14 08 00:23:11.686 READ DMA EXT
c8 00 08 88 0d 00 07 08 00:23:11.672 READ DMA
25 00 88 98 9c 98 20 08 00:23:11.657 READ DMA EXT
27 00 00 00 00 00 00 08 00:23:11.657 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 00 08 00:23:11.648 IDENTIFY DEVICE
Error 35 occurred at disk power-on lifetime: 35412 hours (1475 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 50 8c f3 e0 Error: UNC 8 sectors at LBA = 0x00f38c50 = 15961168
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 50 8c f3 14 08 00:23:08.723 READ DMA EXT
25 00 e0 50 8d f3 14 08 00:23:08.709 READ DMA EXT
25 00 88 10 b3 98 20 08 00:23:08.693 READ DMA EXT
25 00 c8 88 8b f3 14 08 00:23:08.692 READ DMA EXT
25 00 50 30 8b f3 14 08 00:23:08.678 READ DMA EXT
Error 34 occurred at disk power-on lifetime: 35412 hours (1475 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 50 8c f3 e0 Error: UNC 8 sectors at LBA = 0x00f38c50 = 15961168
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 50 8c f3 14 08 00:17:52.906 READ DMA EXT
27 00 00 00 00 00 00 08 00:17:52.906 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 00 08 00:17:52.897 IDENTIFY DEVICE
ef 03 46 00 00 00 00 08 00:17:52.891 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 08 00:17:52.889 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
Error 33 occurred at disk power-on lifetime: 35412 hours (1475 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 50 8c f3 e0 Error: UNC 8 sectors at LBA = 0x00f38c50 = 15961168
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 50 8c f3 14 08 00:17:49.972 READ DMA EXT
25 00 08 80 8b f3 14 08 00:17:49.971 READ DMA EXT
25 00 08 80 8a f3 14 08 00:17:49.969 READ DMA EXT
25 00 08 80 89 f3 14 08 00:17:49.967 READ DMA EXT
25 00 08 80 88 f3 14 08 00:17:49.964 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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